Phone: (520) 579-0047
2015 N. Forbes Blvd., Suite 109
Tucson, AZ 85745
Map (pdf format)
Lynium LLC offers a variety of specialized electronic devices, services, and information.
Our main product is a system to test analog-to-digital converters (ADCs)
and digital-to-analog converters (DACs). This system, the ATS4000, is the first
of its kind to combine both AC and DC test capabilities for high-resolution and
Various presentations at the International Conference on Signal Processing
Applications and Technology Conference from September 1997 through 2000. Topics
that were covered included getting the best performance from ADCs and DACs,
using ADCs and DACs for digital signal processing, and understanding the
intricacies of ADCs and DACs for "digital" engineers.
First place design award in EE Times "Great Technology Challenge" in the area
of education. The proposal was for an "automatic note taking" system which would
record an instructor's voice and written information via very low cost methods.
The student could then review material at a later time using their personal computer.
Design award in the EDN/Philips Microcontroller Contest for a programmable power supply
using a derivative of the 8051 architecture. The entry, entitled "An Efficient, Digitally
Controlled Laboratory Power Supply," appears on page 35 of Philips Semiconductor's "Dream
Machine" Application Reference Book.
- 2017: For use within the testQube, a small form-factor CORDIC design was developed in Verilog
and verified on a Xilinx Spartan 6 development board. This CORDIC will compute 20-bit sine
values for use in the 24 DC + AC precision sources of the testQube (six per quadrant).
Development of this technology allows sine computation to be moved from a digital signal
processor (DSP) to a field programmable gate array (FPGA).
- 2014 to 2016: Lynium worked closely with a major semiconductor company to test multiple
12-bit ADCs, 12-bit DACs, and programmable gain amplifiers (PGAs) embedded into a single microcontroller.
Test techniques were developed, issues were explored, C code was developed, and all of these were
refined over the indicated period of time. The end result was a significant reduction in the
amount of time necessary to validate and characterize new silicon with multiple ADCs, DACs,
- 2013: Developed the ARM5672 for use in testing a dual 18-bit SAR ADC with both ADCs
operating at rates up to 1 MSPS. The ARM5672 includes five DSPs, one Xilinx Spartan 6
XC6SLX150 FPGA, static random access memory (SRAM), and double-date rate (DDR) dynamic
- 2003: Completed development of the hardware and software necessary to test low-resolution
24-bit delta-sigma ADCs such as Linear Technology's LTC2410. We were able to test this
device to data sheet specifications on the ATS4000. Tests include linearity, output noise,
common-mode rejection, normal-mode rejection, and power supply rejection.
- 2002: Developed the General Access Platform (GAP) 1616 and Advanced Resource Module (ARM)
6444 hardware and associated software for the ATS4000. This extends the functionality of the
ATS4000 and allows end-users to test a wide variety of stand-alone ADCs and also ADCs embedded
in microcontrollers and SOCs.
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